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首页> 外文期刊>Diagnostic cytopathology >CT-Guided Aspiration Cytology of Advanced Silicosis and Confirmation of the Deposited Zeolite Nano Particles Through X Ray Diffraction A Novel Approach
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CT-Guided Aspiration Cytology of Advanced Silicosis and Confirmation of the Deposited Zeolite Nano Particles Through X Ray Diffraction A Novel Approach

机译：晚期矽肺的CT引导抽吸细胞学和通过X射线衍射确定沸石纳米颗粒的沉积新方法

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摘要

Silicosis is a common occupational lung disease, resulting in fibrotic nodular lesions in the upper lobes of the lung parenchyma. Most of the pneumoconioses are diagnosed on the basis of relevant history and clinico-radiological correlation. Image-guided aspiration cytology appears to be poorly yielding and is not usually considered as a diagnostic modality. However, silicosis may sometimes offer a diagnostic challenge because of its radiological resemblance and clinical overlap with pulmonary tuberculosis and neoplastic lesions. We present a unique situation where image-guided fine needle aspiration cytology (FNAC) has been advised on the basis of nodular upper lobe opacities. The cytology smears revealed hypocellular granular material, while phase contrast and polarized light microscopy highlighted crystalline particles. History of silica dust exposure long back was available after the cytological evaluation, suggesting the diagnosis of pulmonary silicosis. X ray diffraction (XRD) crystallography was also possible on cytology smears, confirming zeolite nano particles of size as small as 40 - 50 nm as the concerned agent for the first time. Cytological evaluation by phase contrast and polarized light micros-copy may be useful for the confirmation of silicosis, supplemented by clinical history and radiological evaluation. XRD on smears may help in determination of chemical nature and particle size. (C) 2015 Wiley Periodicals, Inc.
机译：矽肺病是一种常见的职业性肺部疾病，导致肺实质上叶的纤维化结节性病变。大多数肺尘埃沉着病是根据相关病史和临床放射学相关性诊断的。图像引导的抽吸细胞学检查似乎收率不好，通常不被认为是诊断方法。但是，矽肺病有时可能会带来诊断挑战，因为其放射学相似性以及与肺结核和肿瘤性病变的临床重叠。我们提出了一种独特的情况，即根据结节上叶混浊建议了图像引导的细针穿刺细胞学检查（FNAC）。细胞学涂片检查显示细胞下层有颗粒状物质，而相衬和偏光显微镜检查则显示出结晶颗粒。进行细胞学评估后，可以发现很长一段时间以来二氧化硅粉尘暴露的历史，提示诊断为肺矽肺病。在细胞学涂片上也可能进行X射线衍射（XRD）晶体学检查，这首次确认了与相关试剂一样小至40至50 nm的沸石纳米颗粒。通过相差和偏光显微镜进行细胞学评估可能有助于确定矽肺病，并辅以临床病史和放射学评估。涂片上的XRD可能有助于确定化学性质和粒径。 （C）2015威利期刊公司

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