Using quantitative electron microscopy for process mineralogy applications

P. Gottlieb; G. Wilkie; D. Sutherland; E. Ho-Tun; S. Suthers; K. Perera; B. Jenkins; S. Spencer; A. Butcher; J. Rayner

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Using quantitative electron microscopy for process mineralogy applications

机译：使用定量电子显微镜进行工艺矿物学应用

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Quantitative microscopy using scanning electron microscopy-based automatic measurement methods and data-processing techniques that provide broad ranges of applications is very popular in the mining industry. These systems determine the quantities and microtextures of the ore samples and metallurgical products to guide process development and troubleshoot processing problems.

机译：在采矿业中，使用基于扫描电子显微镜的自动测量方法和数据处理技术的定量显微镜技术提供了广泛的应用范围。这些系统确定矿石样品和冶金产品的数量和微观结构，以指导工艺开发并解决工艺问题。

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《JOM》 |2000年第4期|共2页
作者
P. Gottlieb; G. Wilkie; D. Sutherland; E. Ho-Tun; S. Suthers; K. Perera; B. Jenkins; S. Spencer; A. Butcher; J. Rayner;
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正文语种 eng
中图分类有色金属冶炼;金属学与金属工艺;
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1. Using quantitative electron microscopy for process mineralogy applications [J] . P. Gottlieb, G. Wilkie, D. Sutherland, JOM . 2000,第4期

机译：使用定量电子显微镜进行工艺矿物学应用
2. Electron backscattered diffraction analyses combined with environmental scanning electron microscopy: potential applications for non-conducting, uncoated mineralogical samples [J] . Habesch S.M. Materials Science and Technology . 2000,第11期

机译：电子背散射衍射分析与环境扫描电子显微镜相结合：非导电，无涂层矿物学样品的潜在应用
3. Electron backscattered diffraction analyses combined with environmental scanning electron microscopy: potential applications for non-conducting, uncoated mineralogical samples [J] . S. M. Habesch Materials Science and Technology: MST: A publication of the Institute of Metals . 2000,第11a12期

机译：电子背散射衍射分析与环境扫描电子显微镜相结合：非导电，无涂层矿物学样品的潜在应用
4. Use of Scanning Electron Microscopy-Based Automated Quantitative Mineralogy for the Characterisation of Ni-Rich and Ni-Poor Goethite in Laterites [C] . J Andersen, G Rollinson, B Snook International Congress for Applied Mineralogy . 2008

机译：使用扫描电子显微镜的自动定量矿物质在后面的富含Ni的富含Ni和Ni贫困的Geethite的表征
5. Four Dimensional Scanning Transmission Electron Microscopy: Applications and Data Processing with Machine Learning [D] . Zhang, Chenyu. 2020

机译：四维扫描透射电子显微镜：应用和数据处理机器学习
6. Electronic and optoelectronic applications of solution-processed two-dimensional materials [O] . Jingyun Wang, Bilu Liu 2019

机译：固溶处理二维材料的电子和光电应用
7. Mineralogical Characterization Applied to Iron Ore Tailings from the Desliming Stage with Emphasis on Quantitative Electron Microscopy (Qem) [O] . Arley Henrique de Souza, Fernando Leopoldo von Krüger, Fernando Gabriel da Silva Araújo, 2021

机译：矿物学表征应用于脱硫阶段的铁矿石尾矿，重点是定量电子显微镜（QEM）

Using quantitative electron microscopy for process mineralogy applications

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