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首页> 外文期刊>Circulation journal >Insulin Resistance as a Predictor of the Late Catch-up Phenomenon After Drug-Eluting Stent Implantation
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Insulin Resistance as a Predictor of the Late Catch-up Phenomenon After Drug-Eluting Stent Implantation

机译:胰岛素抵抗作为药物洗脱支架植入后晚追赶现象的预测因子

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摘要

Background: Percutaneous coronary intervention (PCI) is an effective treatment for patients with ischemic heart disease. In particular, restenosis is suppressed after drug-eluting stent (DES) implantation. However, several problems remain. Previously, we reported neointimal proliferation after DES implantation, which was associated with insulin resistance (IR). The aim of the present study was to clarify whether IR is associated with mortality and major adverse cardiac and cerebrovascular events (MACCE) after 1st-generation DES implantation.
机译:背景:经皮冠状动脉介入治疗(PCI)是缺血性心脏病患者的有效治疗方法。特别是在药物洗脱支架(DES)植入后,再狭窄得到抑制。但是,仍然存在一些问题。以前,我们报道了DES植入后新内膜增生,这与胰岛素抵抗(IR)有关。本研究的目的是阐明在第一代DES植入后,IR是否与死亡率以及严重的不良心脏和脑血管事件(MACCE)相关。

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