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首页> 外文期刊>Journal of Applied Crystallography >Electron backscatter diffraction investigation of local misorientations and orientation gradients in connection with evolution of grain boundary structures in deformed and annealed zirconium. A new approach in grain boundary analysis
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Electron backscatter diffraction investigation of local misorientations and orientation gradients in connection with evolution of grain boundary structures in deformed and annealed zirconium. A new approach in grain boundary analysis

机译：电子背散射衍射研究了变形和退火锆中局部取向不良和取向梯度与晶界结构演变的关系。晶界分析的新方法

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The main aim of the present work is to study the relation between microstructural features - such as local misorientations, grain orientation gradients and grain boundary structures - and thermomechanical treatment of hexagonal zirconium (Zr702α). Electron backscatter diffraction (EBSD) topological maps are used to analyze the aforementioned material parameters at the early stages of plastic deformation imposed by channel-die compression, as well as at a partial recrystallization state achieved by brief annealing. The evolution of local misorientations and orientation gradients is investigated using the so-called kernel average misorientation (KAM) and grain orientation spread (GOS) statistics implemented in the TSL OIM data analysis software [TexSEM Laboratories (2004), Draper, UT, USA]. In the case of grain boundaries (GBs) a new method of analysis is presented. As an addition to the classical line segments method, where the grain boundary is represented by line segments that separate particular pairs of neighboring points, an approach that focuses on grain boundary areas is proposed. These areas are represented by sets of EBSD points, which are specially selected from a modified calculation procedure for the KAM. Different evolution mechanisms of intragranular boundaries, low-angle grain boundaries and high-angle grain boundaries are observed depending on the compression direction. The observed differences are consistent with the results obtained from KAM and GOS analysis. It is also concluded that the proposed method of grain boundary characterization seems to be promising, as it provides new and interesting analysis tools such as textures, absolute fractions and other EBSD statistics of the GB areas. This description may be more compatible with a real deformed microstructure, especially for grain boundaries with very small misorientation, which are indeed clustered areas of lattice defect accumulation.
机译：本工作的主要目的是研究微观结构特征之间的关系，例如局部取向错误，晶粒取向梯度和晶粒边界结构，以及六角形锆（Zr702α）的热机械处理。电子背散射衍射（EBSD）拓扑图用于分析上述材料参数，这些材料参数是在通过通道模头压缩施加的塑性变形的早期，以及通过短暂退火实现的部分重结晶状态。使用在TSL OIM数据分析软件[TexSEM Laboratories（2004），Draper，UT，美国]中实现的所谓的内核平均错位（KAM）和晶粒取向扩展（GOS）统计数据，研究了局部错位和方向梯度的演变。 。对于晶界（GBs），提出了一种新的分析方法。作为经典线段方法的补充，在经典线段方法中，用分开特定对相邻点的线段表示晶界，提出了一种关注晶界区域的方法。这些区域由EBSD点集表示，这些点是从KAM的修改后的计算程序中特别选择的。根据压缩方向，观察到晶粒内边界，低角度晶粒边界和高角度晶粒边界的不同演化机理。观察到的差异与从KAM和GOS分析获得的结果一致。结论还表明，所提出的晶界表征方法似乎很有希望，因为它提供了新的有趣的分析工具，例如GB区域的纹理，绝对分数和其他EBSD统计数据。该描述可能与真实的变形微观结构更加兼容，特别是对于取向非常小的晶粒边界而言，这些晶粒边界确实是晶格缺陷积累的聚集区域。

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