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首页> 外文期刊>Journal of Applied Crystallography >Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing-incidence X-ray diffraction
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Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing-incidence X-ray diffraction

机译：多反射掠入射X射线衍射应力分析中的弹性各向异性和堆垛层错问题

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摘要

Multireflection grazing-incidence X-ray diffraction (MGIXD) was used to determine the stress- and strain-free lattice parameter in the surface layer of mechanically treated (polished and ground) tungsten and austenitic steel. It was shown that reliable diffraction stress analysis is possible only when an appropriate grain interaction model is applied to an anisotropic sample. Therefore, verification of the X-ray stress factors (XSFs) was accomplished by measuring relative lattice strains during an in situ tensile test. The results obtained using the MGIXD and standard methods ( and geometries) show that the Reuss and free-surface grain interaction models agree with the experimental data. Moreover, a new interpretation of the MGIXD results was proposed and applied for the first time to measure the probability of stacking faults as a function of penetration depth for a polished and ground austenitic sample. The XSF models verified in the tensile test were used in the analysis of residual stress components.
机译：多反射掠入射X射线衍射（MGIXD）用于确定经过机械处理（抛光和磨削）的钨和奥氏体钢的表面层的无应力和无应变晶格参数。结果表明，仅当将适当的晶粒相互作用模型应用于各向异性样品时，才可能进行可靠的衍射应力分析。因此，通过在原位拉伸试验过程中测量相对晶格应变来完成X射线应力因子（XSF）的验证。使用MGIXD和标准方法（和几何形状）获得的结果表明Reuss和自由表面晶粒相互作用模型与实验数据吻合。此外，提出了对MGIXD结果的新解释，并首次将其用于测量抛光和研磨的奥氏体样品的堆垛层错概率与穿透深度的关系。在拉伸试验中验证的XSF模型用于分析残余应力分量。

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