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首页> 外文期刊>Journal of biomedical materials research. Part B, Applied biomaterials. >Assessing near infrared optical properties of ceramic orthodontic brackets using cross-polarization optical coherence tomography
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Assessing near infrared optical properties of ceramic orthodontic brackets using cross-polarization optical coherence tomography

机译：使用交叉偏振光学相干层析成像技术评估陶瓷正畸托槽的近红外光学性能

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摘要

Secondary decay (caries) under ceramic orthodontic brackets remains a significant dental problem and near infrared cross-polarization optical coherence tomography (CP-OCT) has the potential to detect underlying demineralization. The purpose of this study was to determine the effect of crystalline structure and chemical composition of ceramic brackets on CP-OCT imaging. Four ceramic brackets types, which were divided into monocrystalline and polycrystalline, were examined using CP-OCT. The results of this study demonstrated that the crys-tallinity of the ceramic brackets affected the 1310 nm CP-OCT imaging with the greatest attenuation seen in polycrystalline alumina brackets. The alumina polycrystalline bracket materials had significantly higher attenuation and scattering than alumina monocrystalline brackets (p<0.05, ANOVA, Bonferroni). Additionally, bracket base morphology and composition affected NIR light attenuation. There was considerable attenuation in bracket bases that contained additive zirconium spheres (approx30 mum) and this alteration was significantly greater than the jagged alumina crystallographic alterations found in the other bracket systems (p<0.05, ANOVA, Bonferroni). Noninvasive, near infrared (NIR) cross-polarization optical coherence tomography (CP-OCT) has potential to effectively image through portions of ceramic brackets; however, further investigation into the optical effects of resin integration in the base portion of the brackets is warranted.
机译：陶瓷正畸托槽下的二次腐烂（龋齿）仍然是一个严重的牙科问题，近红外交叉偏振光学相干断层扫描（CP-OCT）具有检测潜在的脱矿质的潜力。这项研究的目的是确定陶瓷支架的晶体结构和化学成分对CP-OCT成像的影响。使用CP-OCT检查了四种陶瓷支架类型，分为单晶和多晶。这项研究的结果表明，陶瓷托架的哭声倾斜度影响了1310 nm CP-OCT成像，在多晶氧化铝托架中看到的衰减最大。氧化铝多晶支架材料比氧化铝单晶支架具有更高的衰减和散射（p <0.05，ANOVA，Bonferroni）。此外，支架的基本形态和成分也会影响NIR光衰减。含有添加锆球（约30微米）的托槽底座有相当大的衰减，这种变化明显大于其他托槽系统中锯齿状氧化铝晶体学变化（p <0.05，ANOVA，Bonferroni）。无创，近红外（NIR）交叉偏振光学相干断层扫描（CP-OCT）有潜力通过陶瓷托架的某些部分有效成像。但是，有必要进一步研究支架底部的树脂集成的光学效果。

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