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首页> 外文期刊>Journal of biomedical materials research. Part B, Applied biomaterials. >Evidence of yttrium silicate inclusions in YSZ-porcelain veneers
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Evidence of yttrium silicate inclusions in YSZ-porcelain veneers

机译：YSZ-瓷贴面中硅酸钇夹杂物的证据

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摘要

This report introduces the discovery of crystalline defects that can form in the porcelain veneering layer when in contact with yttria-stabilized zirconia (YSZ). The focus was on dental prostheses and understanding the defects that form in the YSZ/porcelain system; however the data reported herein may have broader implications toward the use and stability of YSZ-based ceramics in general. Specimens were cut from fully sintered YSZ plates and veneering porcelain was applied (<1 mm thick) to one surface and fired under manufacturer's recommended protocol. Scanning electron microscopy (SEM) with integrated electron dispersive X-ray (EDAX) was used for microstructural and elemental analysis. EDAX, for chemical analysis and transmission electron diffraction (TED) for structural analysis were both performed in the transmission electron microscope (TEM). Additionally, in order to spatially resolve Y-rich precipitates, micro-CT scans were conducted at varying depths within the porcelain veneer. Local EDAX (SEM) was performed in the regions of visible inclusions and showed significant increases in yttrium concentration. TEM specimens also showed apparent inclusions in the porcelain and selected area electron diffraction was performed on these regions and found the inclusions to be crystalline and identified as either yttrium-silicate (Y_2SiO_5) or yttrium-disilicate (Y_2Si_2O_7). Micro-CT data showed that yttrium-silicate precipitates were distributed throughout the thickness of the porcelain veneer. Future studies are needed to determine whether many of the premature failures associated with this materials system may be the result of crystalline flaws that form as a result of high temperature yttrium diffusion near the surfaces of YSZ.
机译：该报告介绍了与氧化钇稳定的氧化锆（YSZ）接触时可在瓷饰面层中形成的结晶缺陷的发现。重点是假牙和了解YSZ /瓷器系统中形成的缺陷;然而，本文报道的数据通常对于基于YSZ的陶瓷的使用和稳定性可能具有更广泛的含义。从完全烧结的YSZ板上切下标本，将饰面瓷（<1毫米厚）涂在一个表面上，并按照制造商推荐的规程烧制。带有集成电子弥散X射线（EDAX）的扫描电子显微镜（SEM）用于微观结构和元素分析。用于化学分析的EDAX和用于结构分析的透射电子衍射（TED）均在透射电子显微镜（TEM）中进行。另外，为了在空间上分解富含Y的沉淀物，在瓷贴面内的不同深度进行了微CT扫描。在可见的夹杂物区域进行了局部EDAX（SEM），结果表明钇浓度显着增加。 TEM样品还显示出瓷器中明显的夹杂物，并对这些区域进行了选择区域电子衍射，发现夹杂物是结晶的，并鉴定为硅酸钇（Y_2SiO_5）或二硅酸钇（Y_2Si_2O_7）。 Micro-CT数据表明，硅酸钇沉淀物分布在整个瓷贴面的厚度上。需要进行进一步的研究来确定与该材料系统相关的许多过早失效是否可能是由于YSZ表面附近的高温钇扩散而形成的晶体缺陷的结果。

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