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首页> 外文期刊>Journal of Experimental and Theoretical Physics >The kinetics of low-temperature electron–phonon relaxation in a metallic film following instantaneous heating of the electrons
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The kinetics of low-temperature electron–phonon relaxation in a metallic film following instantaneous heating of the electrons

机译：电子瞬时加热后，金属膜中低温电子-声子弛豫的动力学

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摘要

The theoretical analysis of experiments on pulsed laser irradiation of metallic films sputtered on insulating supports is usually based on semiphenomenological dynamical equations for the electron and phonon temperatures, an approach that ignores the nonuniformity and the nonthermal nature of the phonon distribution function. In this paper we discuss a microscopic model that describes the dynamics of the electron–phonon system in terms of kinetic equations for the electron and phonon distribution functions. Such a model provides a microscopic picture of the nonlinear energy relaxation of the electron–phonon system of a rapidly heated film. We find that in a relatively thick film the energy relaxation of electrons consists of three stages: the emission of nonequilibrium phonons by "hot" electrons, the thermalization of electrons and phonons due to phonon reabsorption, and finally the cooling of the thermalized electron–phonon system as a result of phonon exchange between film and substrate. In thin films, where there is no reabsorption of nonequilibrium phonons, the energy relaxation consists of only one stage, the first. The relaxation dynamics of an experimentally observable quantity, the phonon contribution to the electrical conductivity of the cooling film, is directly related to the dynamics of the electron temperature, which makes it possible to use the data of experiments on the relaxation of voltage across films to establish the electron–phonon and phonon–electron collision times and the average time of phonon escape from film to substrate.
机译：对在绝缘载体上溅射的金属膜进行脉冲激光辐照实验的理论分析通常基于电子和声子温度的半现象动力学方程，该方法忽略了声子分布函数的不均匀性和非热性质。在本文中，我们讨论了一个微观模型，该模型根据电子和声子分布函数的动力学方程描述了电子-声子系统的动力学。这种模型提供了快速加热薄膜的电子-声子系统的非线性能量弛豫的微观图像。我们发现，在相对厚的薄膜中，电子的能量弛豫包括三个阶段：“热”电子发射非平衡声子，由于声子重吸收而使电子和声子热化，最后是热化的电子-声子的冷却薄膜和基材之间进行声子交换的结果。在没有非平衡声子重吸收的薄膜中，能量弛豫仅包括一个阶段，第一个阶段。实验可观察到的量的弛豫动力学，即声子对冷却膜电导率的贡献，与电子温度的动力学直接相关，这使得可以使用关于跨膜电压弛豫的实验数据确定电子-声子和声子-电子的碰撞时间以及声子从薄膜到基材逸出的平均时间。

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