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首页> 外文期刊>Journal of manufacturing science and engineering: Transactions of the ASME >Assessment of Dimensional Integrity and Spatial Defect Localization in Additive Manufacturing Using Spectral Graph Theory
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Assessment of Dimensional Integrity and Spatial Defect Localization in Additive Manufacturing Using Spectral Graph Theory

机译：利用谱图理论评估增材制造中的尺寸完整性和空间缺陷定位

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摘要

The ability of additive manufacturing (AM) processes to produce components with virtually any geometry presents a unique challenge in terms of quantifying the dimensional quality of the part. In this paper, a novel spectral graph theory (SGT) approach is proposed for resolving the following critical quality assurance concern in the AM: how to quantify the relative deviation in dimensional integrity of complex AM components. Here, the SGT approach is demonstrated for classifying the dimensional integrity of standardized test components. The SGT-based topological invariant Fiedler number (lambda(2)) was calculated from 3D point cloud coordinate measurements and used to quantify the dimensional integrity of test components. The Fiedler number was found to differ significantly for parts originating from different AM processes (statistical significance p-value <1%). By comparison, prevalent dimensional integrity assessment techniques, such as traditional statistical quantifiers (e.g., mean and standard deviation) and examination of specific facets/landmarks failed to capture part-to-part variations, proved incapable of ranking the quality of test AM components in a consistent manner. In contrast, the SGT approach was able to consistently rank the quality of the AM components with a high degree of statistical confidence independent of sampling technique used. Consequently, from a practical standpoint, the SGT approach can be a powerful tool for assessing the dimensional integrity of the AM components, and thus encourage wider adoption of the AM capabilities.
机译：在量化零件的尺寸质量方面，增材制造（AM）工艺生产几乎任何几何形状零件的能力提出了独特的挑战。在本文中，提出了一种新颖的光谱图理论（SGT）方法来解决AM中的以下关键质量保证问题：如何量化复杂AM组件尺寸完整性的相对偏差。在这里，展示了SGT方法用于对标准化测试组件的尺寸完整性进行分类。根据3D点云坐标测量值计算出基于SGT的拓扑不变Fiedler数（lambda（2）），并将其用于量化测试组件的尺寸完整性。发现源自不同AM过程的零件的Fiedler数显着不同（统计显着性p值<1％）。相比之下，普遍的尺寸完整性评估技术（例如传统的统计量词（例如，均值和标准差）以及对特定方面/地标的检查）无法捕获部件之间的差异，因此无法对测试AM组件的质量进行排名。一致的方式。相反，SGT方法能够以高度的统计置信度始终如一地对AM组件的质量进行排名，而与所使用的采样技术无关。因此，从实际的角度来看，SGT方法可以成为评估AM组件尺寸完整性的有力工具，从而鼓励AM技术广泛采用。

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