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首页> 外文期刊>Journal of Macromolecular Science. Pure and Applied Chemistry >Determination of Electron and Hole Mobility of Regioregular Poly(3-hexylthiophene) by the Time of Flight Method
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Determination of Electron and Hole Mobility of Regioregular Poly(3-hexylthiophene) by the Time of Flight Method

机译:飞行时间法测定区域规则聚(3-己基噻吩)的电子和空穴迁移率

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摘要

Time of flight method (TOF) is used to measure the electron and hole mobility of a spin coated regioregular poly(3-hexylthiophene) (P3HT) film. We find that both electron and hole have the same mobility (about 3.83.9×10-4 cm2/Vs) at an applied field of 120 kV/cm. It is demonstrated in this paper that the electron-hole recombination process may prevent the electron transport in the material due to the fact that the carrier recombination time is much shorter than the transit time.
机译:飞行时间方法(TOF)用于测量旋涂的区域规则的聚(3-己基噻吩)(P3HT)薄膜的电子和空穴迁移率。我们发现在120 kV / cm的外加电场下,电子和空穴具有相同的迁移率(约3.83.9×10-4 cm2 / Vs)。本文证明,由于载流子复合时间远短于渡越时间,电子-空穴复合过程可能阻止电子在材料中的传输。

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