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Magnetic resonance force microscopy combined with surface topography

机译:磁共振力显微镜结合表面形貌

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摘要

A new method of surface microscopy is proposed, which combines three-dimensional electron spin resonance imaging by magnetic resonance force microscopy (MRFM) and topographic imaging of the sample surface by scanning force microscopy (SFM). In order to demonstrate its potential for the identification of microscale objects, the individual and combined images are used to provide the locations, shapes and spin density distributions of target phantom objects. We report spatial resolution in MRFM of 2.8 x 2.8 x 2.0 mu m(3). This could be improved to the theoretical limit of 0.08 x 0.08 x 0.04 mu m(3) through reduction of the thermal noise by cooling to cryogenic temperatures similar to 0.5 K. We believe that this type of microscopy will become a very useful tool for the investigation of anomalies induced in surfaces by materials buried below the surface. (C) 2007 Elsevier Inc. All rights reserved.
机译:提出了一种新的表面显微镜方法,该方法将通过磁共振力显微镜(MRFM)进行的三维电子自旋共振成像与通过扫描力显微镜(SFM)对样品表面进行形貌成像相结合。为了证明其在识别微型物体方面的潜力,使用单独的图像和组合的图像来提供目标体模对象的位置,形状和自旋密度分布。我们在MRFM中报告了2.8 x 2.8 x 2.0微米(3)的空间分辨率。通过冷却到类似于0.5 K的低温可降低热噪声,可以将其提高到理论极限0.08 x 0.08 x 0.04μm(3)。我们相信,这种显微镜将成为一种非常有用的工具研究埋在表面下的材料在表面上引起的异常。 (C)2007 Elsevier Inc.保留所有权利。

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