...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Journal of Materials Chemistry: An Interdisciplinary Journal dealing with Synthesis, Structures, Properties and Applications of Materials, Particulary Those Associated with Advanced Technology >Preparation of Y_2O_3-stabilized ZrO_2 thin electrolyte films from Langmuir-Blodgett film precursors by means of 'surface ions'
【24h】

Preparation of Y_2O_3-stabilized ZrO_2 thin electrolyte films from Langmuir-Blodgett film precursors by means of 'surface ions'

机译：由朗缪尔-布洛杰特薄膜前体通过“表面离子”制备Y_2O_3稳定的ZrO_2电解质薄膜

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Ultrathin Y_2O_3-stabilized ZrO_2 films have been prepared using Langmuir-Blodgett (LB) films as precursors. The beta-diketonate complexes zirconium (IV) 2,2,6,6-tetramethylheptanedionate (Zr(tmhd)_4) and yttrium (III) 2,2,6,6-tetramethylheptanedionate (Y(tmhd)-3) were chosen as the "surface ions" which can combine with arachidic acid (AA) to form uniform mixed monolayers on pure water. Y-type LB films were fabricated by depositing the mixed monolayers with a mixing ratio of Y (tmhd)_3/Zr(tmhd)_4/AA = 1:4.5:11. The YSZ films were obtained thorugh a combination of low temperature ultra-violet/ozone (UVO) decomposition and annealing treatments at high temperature. X-Ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) measurements dmeonstrate that the final films are a single YSZ phase with a fluorite cubic structure and the composition of the films can be well controlled throughout the whole process. Atomic force microscopy (AFM) and cross-section scanning electronic microscopy (SEM) have been employed to reveal the character of the final films.
机译：使用Langmuir-Blodgett（LB）薄膜作为前体制备了超薄的Y_2O_3稳定的ZrO_2薄膜。选择β-二酮酸酯络合物2,4,6,6-四甲基庚二酸锆（IV）（Zr（tmhd）_4）和钇（III）2,2,6,6-四甲基庚二酮酸（Y（tmhd）-3）作为选择可以与花生酸（AA）结合形成在纯净水上均匀混合的单层的“表面离子”。通过以Y（tmhd）_3 / Zr（tmhd）_4 / AA = 1：4.5：11的混合比沉积混合的单层膜来制作Y型LB膜。通过低温紫外线/臭氧（UVO）分解和高温退火处理的组合获得YSZ薄膜。 X射线衍射（XRD）和X射线光电子能谱（XPS）测量表明，最终膜是具有萤石立方结构的单一YSZ相，并且在整个过程中都可以很好地控制膜的组成。原子力显微镜（AFM）和横截面扫描电子显微镜（SEM）已用于揭示最终膜的特性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号