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首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >EXAFS at the BiLIII edge in Bi4Ge3O12 and in xBi(2)O(3)-(100-x)GeO2 glasses
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EXAFS at the BiLIII edge in Bi4Ge3O12 and in xBi(2)O(3)-(100-x)GeO2 glasses

机译：在Bi4Ge3O12和xBi（2）O（3）-（100-x）GeO2玻璃中的BiLIII边缘处的EXAFS

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Extended X-ray absorption fine structure (EXAFS) measurements were made on crystalline Bi4Ge3O12 and xBi(2)O(3)- (100-x)GeO2 glasses at the BiLIII edge. Calculations of the EXAFS interference function, using theoretical backscattering amplitude and phase functions, are consistent with the crystalline structure of Bi4Ge3O12 up to high Bi coordination shells. Around bismuth atoms in glasses a large spread in the Bi-O bond distances was found, and the Bi environment as seen by EXAFS is similar to that observed in crystalline alpha-Bi2O3. The local structure in the glasses is independent of composition and does not change appreciably for different quenching procedures. (C) 1998 Elsevier Science B.V. [References: 27]
机译：在BiLIII边缘的晶体Bi4Ge3O12和xBi（2）O（3）-（100-x）GeO2玻璃上进行了扩展的X射线吸收精细结构（EXAFS）测量。使用理论反向散射幅度和相位函数计算EXAFS干扰函数，与Bi4Ge3O12直至高Bi配位壳的晶体结构一致。在玻璃中的铋原子周围发现了Bi-O键距离的较大分布，并且EXAFS观察到的Bi环境类似于晶体α-Bi2O3中观察到的Bi环境。玻璃中的局部结构与组成无关，并且对于不同的淬火程序不会明显改变。 （C）1998 Elsevier Science B.V. [参考：27]

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