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首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >XAFS study of six-coordinated silicon in R2O–SiO2–P2O5 (R = Li, Na, K) glasses
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XAFS study of six-coordinated silicon in R2O–SiO2–P2O5 (R = Li, Na, K) glasses

机译：XAFS研究R2O–SiO2–P2O5（R = Li，Na，K）玻璃中六配位硅

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摘要

The local structures around silicon and phosphorous atoms in R2O–SiO2–P2O5 (R = Li, Na and K) glasses have been investigated using Si and P K-edge XAFS spectroscopy by transmission mode at BL-4 and BL-3 at the synchrotron facility in Ritsumeikan University. As a result of XANES and EXAFS analyzes, six-coordinated silicon atoms were observed in the glasses. The fraction of six-coordinated silicon atom changed with increasing of the concentration of alkali oxide and P2O5. For the change of concentration of alkali oxide, it takes maximum values which are 60% in Li2O, 90% in Na2O and 85% in K2O system at 20 mol% alkali oxide. It gradually increased up for the increase of the concentration of P2O5 to 55% in Li2O, 80% in Na2O and 90% in K2O system. The Si–O inter-atomic distance in the glasses changes from 1.63 to 1.79 A with increasing the fraction of six-coordinated silicon atom. On the other hand, it was not observed the local structural change around the phosphorous atom.
机译：使用Si和PK边缘XAFS光谱，通过同步加速器在BL-4和BL-3处的透射模式，研究了R2O-SiO2-P2O5（R = Li，Na和K）玻璃中硅和磷原子周围的局部结构立命馆大学的设施XANES和EXAFS分析的结果是，在玻璃中观察到六配位的硅原子。六配位硅原子的分数随碱金属氧化物和P2O5浓度的增加而变化。对于碱金属氧化物浓度的变化，在20 mol％碱金属氧化物下，其最大值为Li2O中的60％，Na2O中的90％和K2O系统中的85％。随着P2O5浓度的增加，Li2O中的P5O浓度逐渐增加到55％，Na2O中的P2O5浓度增加到K2O系统中的90％。随着六配位硅原子分数的增加，玻璃中Si–O原子间的距离从1.63变为1.79A。另一方面，未观察到磷原子周围的局部结构变化。

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