Determination of partial pair distribution functions in amorphous Ge15Te85 by simultaneous RMC simulation of diffraction and EXAFS data

Kaban I; Jovari P; Hoyer W; Welter E

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Determination of partial pair distribution functions in amorphous Ge15Te85 by simultaneous RMC simulation of diffraction and EXAFS data

机译：通过衍射和EXAFS数据的同时RMC模拟确定非晶Ge15Te85中的部分对分布函数

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The atomic structure of amorphous Ge15Te85 has been studied by X-ray absorption spectroscopy (EXAFS) at Ge K-edge. EXAFS data were modeled simultaneously with existing X-ray and neutron diffraction measurements by the reverse Monte Carlo (RMC) simulation technique. Combination of the three independent measurements allowed separation of the partial pair correlation functions g(GeTe)(r) and g(TeTe)(r) and estimation of the corresponding coordination numbers. (C) 2007 Elsevier B.V. All rights reserved.

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《Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites》 |2007年第25期|共5页
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Kaban I; Jovari P; Hoyer W; Welter E;
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正文语种 eng
中图分类晶体学;
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neutron diffraction/scattering; x-ray diffraction; chalcogenides; Monte Carlo simulations; short-range order; NEUTRON;

机译：中子衍射/散射;x射线衍射;硫族化物;Monte Carlo模拟;短程有序;NEUTRON;

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1. Determination of partial pair distribution functions in amorphous Ge15Te85 by simultaneous RMC simulation of diffraction and EXAFS data [J] . Kaban I, Jovari P, Hoyer W, Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites . 2007,第24a25期

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Determination of partial pair distribution functions in amorphous Ge15Te85 by simultaneous RMC simulation of diffraction and EXAFS data

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