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Surface and bulk residual stresses in Li2O center dot 2SiO(2) glass-ceramics

机译:Li2O中心点2SiO(2)玻璃陶瓷中的表面和整体残余应力

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摘要

In the present work surface and bulk residual stresses generated in partially crystallized Li2O center dot 2SiO(2) glass-ceramics are analyzed after different heat treatments. The phase specific residual stresses in the crystalline Li2Si2O5-phase are evaluated for the first time in the nearsurface zone and the bulk of the samples using both medium and high energy synchrotron radiation. The results reveal that in the crystals within the bulk of the samples micro residual stresses generated by the thermal anisotropy of the isolated individual crystallites depend on the crystallographic direction. In contrast, the residual stress state in the near-surface zone is isotropic due to the superposition of thermal residual stresses in and around the crystals of the near-surface area. Residual stress calculations using a modified Selsing's model yield a good estimate of the anisotropic residual stresses in the bulk crystallites, whereas the isotropic residual stress state in the crystallized surface layer can be described by an elastic stress model for thin films. (C) 2007 Elsevier B.V. All rights reserved.
机译:在本工作表中,通过不同的热处理分析了部分结晶的Li2O中心点2SiO(2)玻璃陶瓷中产生的表面残余应力和整体残余应力。使用中能和高能同步加速器辐射,首次在近表面区域和大部分样品中评估了结晶Li2Si2O5相中的相比残余应力。结果表明,在大部分样品中的晶体中,由分离出的单个微晶的热各向异性产生的微小残余应力取决于晶体学方向。相反,由于近表面区域的晶体中和周围晶体的热残余应力的叠加,近表面区域中的残余应力状态是各向同性的。使用改进的Selsing模型计算残余应力可以很好地估计块状微晶中的各向异性残余应力,而结晶表面层中的各向同性残余应力状态可以通过薄膜的弹性应力模型来描述。 (C)2007 Elsevier B.V.保留所有权利。

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