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首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >Synthesis and characterization of TM-doped CuO (TM = Fe, Ni)
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Synthesis and characterization of TM-doped CuO (TM = Fe, Ni)

机译：掺杂TM的CuO（TM = Fe，Ni）的合成与表征

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摘要

Polycrystalline Cu1-xTMxO samples (x = 0 and 0.06; TM = Ni2+ and Fe3+) were grown using a co-precipitation method. The structural and magnetic properties were investigated by means of temperature dependent magnetic susceptibility and room temperature X-ray powder diffraction (XRPD). The XRPD analyses of the samples reveal the formation of single phase with structure isomorphous to the CuO. Interestingly, T-dependent magnetization shows the reduction of Neel temperature, T-N, from 213 K in the copper oxide to 70 K in the Fe-doped sample (x = 0.06). Because in the Ni-doped samples TN seems to be unaffected, this decrease in TN is believed to be due to the different electronic structure of the dopant. The ferromagnetic behavior observed at room temperature in all samples can be related to both the level of oxygen (excess or vacancy) of our samples and to the difference in the magnetic structure of the dopant.
机译：使用共沉淀法生长多晶Cu1-xTMxO样品（x = 0和0.06; TM = Ni2 +和Fe3 +）。通过与温度有关的磁化率和室温X射线粉末衍射（XRPD）研究了结构和磁性。样品的XRPD分析表明，单相的形成与CuO同构。有趣的是，依赖T的磁化强度显示Neel温度T-N从氧化铜中的213 K降低到掺铁样品中的70 K（x = 0.06）。因为在镍掺杂的样品中TN似乎没有受到影响，所以TN的这种下降被认为是由于掺杂剂的电子结构不同所致。在室温下在所有样品中观察到的铁磁行为可能与我们样品中的氧气水平（过量或空位）以及掺杂剂磁性结构的差异有关。

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