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首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >Investigation of near constant loss contribution to conductivity in lithium bismo-silicate glasses
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Investigation of near constant loss contribution to conductivity in lithium bismo-silicate glasses

机译：二甲基硅酸锂玻璃的几乎恒定损耗对电导率的影响

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摘要

Glasses having compositions 20Li(2)O center dot(80-x)Bi2O3 center dot xSiO(2) (x = 55, 60, 65, 70 mol%) were investigated using impedance spectroscopy in the frequency range from 20 Hz to 1 MHz and in the temperature range from 543 to 663 K. The ac and dc conductivities, activation energy of the dc conductivity and relaxation frequency are extracted from the impedance spectra. The increase in conductivity with increase in SiO2 content is attributed to the change in the structural units of bismuth. Both electric modulus and the conductivity formalism have been employed to study the relaxation dynamics of charge carriers in these glasses. A single 'master curve' for normalized plots of all the modulus isotherms observed for a given composition indicates the temperature independence of the dynamic processes for ions in these glasses. Similar values of activation energy for dc conduction and for conductivity relaxation time indicates that the ions overcome same energy barrier while conducting and relaxing. The observed conductivity spectra follows power law with exponent 's' which increases regularly with frequency and approaches unity at higher frequencies. Near constant losses (NCL) characterize this linearly dependent region of conductivity spectra. A deviation from 'super curve' for various isotherms of conductivity spectra was also observed in high frequency region and at low temperatures, which supports the existence of different dynamic processes like NCL in addition to the ion hopping processes in the investigated glass system. (C) 2008 Elsevier B.V. All rights reserved.
机译：使用阻抗谱在20 Hz至1 MHz的频率范围内研究了成分为20Li（2）O中心点（80-x）Bi2O3中心点xSiO（2）（x = 55、60、65、70 mol％）的玻璃在543至663 K的温度范围内。从阻抗谱中提取出交流电导率，直流电导率，直流电导率的活化能和弛豫频率。电导率随SiO2含量的增加而增加，归因于铋的结构单元的变化。电模量和电导率形式主义已被用于研究这些玻璃中电荷载流子的弛豫动力学。对于给定成分观察到的所有模量等温线的归一化图的单个“主曲线”表明这些玻璃中离子动态过程的温度独立性。直流传导和电导率弛豫时间的活化能值相似，表明离子在传导和弛豫时克服了相同的能垒。观察到的电导率谱遵循幂定律，指数's随频率规则增加，而在较高频率下趋近于1。接近恒定损耗（NCL）表征了电导率谱的线性相关区域。在高频区域和低温下，还观察到与各种电导率谱等温线的“超级曲线”不同，这支持了所研究的玻璃系统中除离子跳跃过程外还存在其他动态过程，如NCL。 （C）2008 Elsevier B.V.保留所有权利。

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