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首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >X-ray diffraction measurements for expanded fluid-Se using synchrotron radiation
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X-ray diffraction measurements for expanded fluid-Se using synchrotron radiation

机译：使用同步加速器辐射对膨胀流体硒进行X射线衍射测量

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摘要

X-ray diffraction measurements at temperatures up to 1500 deg C and pressures up to 843 bar have been carried out using synchrotron radiation at SPring-8 to investigate structural change in the semiconductor-to-metal transition in expanded fluid-Se. The signal-to-noise ratio in the intensity spectra was better than the previous one using in-house X-ray source. It is found important to estimate the background from a sapphire cell to deduce a structure factor of fluid Se with greater accuracy from the spectra. The preservation of the twofold coordinated chain structure and the contraction of the covalent bond are reconfirmed in the transition. When metallic properties were increased, the first peak in the pair distribution function became asymmetric towards larger distance and the first minimum became larger. These results may imply the modification on the chain structure in the transition.
机译：使用SPring-8上的同步辐射在高达1500摄氏度的温度和高达843 bar的压力下进行X射线衍射测量，以研究膨胀流体Se中半导体向金属过渡的结构变化。强度光谱中的信噪比优于使用内部X射线源的信噪比。发现重要的是估计蓝宝石电池的背景以从光谱中更准确地推断出流体Se的结构因子。在过渡过程中再次确认了二元配位链结构的保留和共价键的收缩。当金属性能提高时，线对分布函数中的第一个峰朝更大的距离变得不对称，而第一个最小值则变得更大。这些结果可能暗示在过渡过程中对链结构的修饰。

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