SANS of ZrO2 center dot SiO2 gels

Margaca FMA; Salvado IMM; Teixeira J; CENS CEA CNRS LLB F-91191 GIF SUR YVETTE FRANCE.

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SANS of ZrO2 center dot SiO2 gels

机译：ZrO2中心点SiO2凝胶的SANS

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Small angle neutron scattering (SANS) measurements have been performed to investigate the nanoscale structure of materials of the system xZrO(2) . SiO2 with x less than or equal to 10 mol%, at different processing stages. The materials were prepared by sol-gel using the alkoxides method, in strong acidic conditions. Samples studied as xerogels were heat-treated at 120 degrees C and 850 degrees C; as wet gels at the gel point; and after 4 h aging at 60 degrees C. The samples showed extended linear chains ca. 10 nm long at the gel point. The aged gel has a mass fractal structure with fractal dimension of ca. 1.8. The 120 degrees C heat-treated xerogel shows homogeneous oxide regions with 16 nm average diameter and mass fractal nature. For the 850 degrees C heat-treated xerogel the oxide regions average diameter reduced to about 13 nm and presented a sharp and smooth surface, obeying the Porod law.

机译：小角中子散射（SANS）测量已经执行，以研究xZrO（2）系统材料的纳米尺度结构。在不同的加工阶段，x小于或等于10 mol％的SiO2。在强酸性条件下，使用醇盐方法通过溶胶-凝胶法制备材料。作为干凝胶研究的样品在120摄氏度和850摄氏度下进行了热处理;作为凝胶点的湿凝胶;并且在60℃下老化4小时之后。样品显示出延长的线性链。胶凝点的长度为10 nm。老化的凝胶具有分形维数约为1的质量分形结构。 1.8。在120摄氏度热处理的干凝胶显示出均匀的氧化物区域，平均直径为16 nm，具有质量分形特征。对于850℃热处理的干凝胶，其氧化物区域的平均直径减小至约13nm，并呈现出尖锐且光滑的表面，遵守Porod定律。

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《Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites》 |1997年第2期|共6页
作者
Margaca FMA; Salvado IMM; Teixeira J; CENS CEA CNRS LLB F-91191 GIF SUR YVETTE FRANCE.;
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正文语种 eng
中图分类晶体学;
关键词
SILICA-GEL; SCATTERING;

机译：硅凝胶;散射;

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2. Reduction of center dot Si Si-3 defect density at the Si/SiO2 interface by sol-gel SiO2 thin film passivation [J] . Oh Sehyun, Lee Seunghyo, Oh Eunseok, Thin Solid Films . 2017,第Juna30期

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SANS of ZrO2 center dot SiO2 gels

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