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首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >Small angle X-ray scattering measurements for expanded fluid Se near the critical point
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Small angle X-ray scattering measurements for expanded fluid Se near the critical point

机译：临界点附近膨胀流体Se的小角度X射线散射测量

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摘要

Small angle X-ray scattering (SAXS) measurements have been carried out to investigate density fluctuations near the critical point of expanded fluid Se. The experiments were performed using a polycrystalline sapphire cell of our design and a high pressure vessel. The vessel has a diamond window for an incident X-ray beam and a Be window for the scattered beams. The absolute scattering intensity was deduced from the measurements on the He gas used as the pressure transmitting medium. The pressure variation of the SAXS intensity for fluid Se at 1630 deg C shows a maximum intensity at 401 bar just below the isochor of the critical density. This is the first observation of critical scattering for fluid Se and a correlation length of 19+-3 A was obtained from an Ornstein-Zernike plot.
机译：已经进行了小角度X射线散射（SAXS）测量，以研究膨胀流体Se临界点附近的密度波动。实验是使用我们设计的多晶蓝宝石电池和高压容器进行的。该容器具有用于入射X射线束的菱形窗口和用于散射束的Be窗口。从作为压力传递介质的氦气的测量值推导出绝对散射强度。在1630摄氏度时，流体Se的SAXS强度的压力变化显示在401 bar处的最大强度，刚好在临界密度的等压线以下。这是对流体Se的临界散射的首次观察，从Ornstein-Zernike图获得了19 + -3 A的相关长度。

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