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Electronic properties of microcrystalline silicon investigated by electron spin resonance and transport measurements

机译:通过电子自旋共振和传输测量研究微晶硅的电子性质

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摘要

The electron spin resonance and transport properties of microcrystalline silicon were investigated. Identification and location of the resonance states in the material are discussed. We analyse the properties of the conduction electron resonance and the relation of the corresponding states with electronic transport. Conduction band tail states within the crystalline regions of the material an proposed as a requirement for the interpretation of the experimental results. (C) 2000 Elsevier Science B.V. All rights reserved. [References: 24]
机译:研究了微晶硅的电子自旋共振和传输性质。讨论了材料中共振态的识别和位置。我们分析了传导电子共振的性质以及相应态与电子传输的关系。建议将材料的结晶区内的导带尾态作为解释实验结果的要求。 (C)2000 Elsevier Science B.V.保留所有权利。 [参考:24]

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