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X-ray reflectivity of zirconia based sol-gel coatings on borosilicate glasses

机译:硼硅酸盐玻璃上氧化锆基溶胶-凝胶涂层的X射线反射率

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摘要

In this work the technique of X-ray reflectometry was applied to study zirconiumsulfate films deposited by sol-gel dip-coating process on a borosilicate glass surface. The influence of withdrawal speed and temperature of thermal treatment on the film structure are analyzed. The thermal evolution of the density and thickness of the film was compared with these properties measured for a monolithic xerogel by helium picnometry and thermomechanical analysis. The fitting of experimental curves by classical reflectivity model showed the presence of an additional layer at Landau-Levich model. The apparent and real densities are similar for coatings fired below 400 deg C, which shows that the films are free of pores. The shrinkage during firing is anisotropic, occurring essentially perpendicular to the coating surface.
机译:在这项工作中,X射线反射法技术被用于研究通过溶胶-凝胶浸涂工艺沉积在硼硅酸盐玻璃表面上的硫酸锆薄膜。分析了抽提速度和热处理温度对薄膜结构的影响。将膜的密度和厚度的热演化与通过氦气皮克法和热机械分析对整块干凝胶测量的这些性质进行了比较。用经典反射率模型拟合实验曲线表明,在Landau-Levich模型中存在附加层。在400℃以下烧成的涂料的表观密度和实际密度相似,这表明薄膜没有孔。焙烧期间的收缩是各向异性的,基本上垂直于涂层表面发生。

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