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首页> 外文期刊>Journal of Microscopy >Scanning near-field optical microscopy using semiconductor nanocrystals as a local fluorescence and fluorescence resonance energy transfer source
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Scanning near-field optical microscopy using semiconductor nanocrystals as a local fluorescence and fluorescence resonance energy transfer source

机译：使用半导体纳米晶体作为局部荧光和荧光共振能量转移源的扫描近场光学显微镜

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Local fluorescence probes based on CdSe semiconductor nanocrystals were prepared and tested by recording scanning near-field optical microscopy (SNOM) images of calibration samples and fluorescence resonance energy transfer SNOM (FRET SNOM) images of acceptor dye molecules inhomogeneously deposited onto a glass substrate. Thousands of nanocrystals contribute to the signal when this probe is used as a local fluorescence source while only tens of those (the most apical) are involved in imaging for the FRET SNOM operation mode. The dip-coating method used to make the probe enables diminishing the number of active fluorescent nanocrystals easily. Prospects to realize FRET SNOM based on a single fluorescence centre using such an approach are briefly described. [References: 21]
机译：通过记录校准样品的扫描近场光学显微镜（SNOM）图像和不均匀沉积在玻璃基板上的受体染料分子的荧光共振能量转移SNOM（FRET SNOM）图像，来制备和测试基于CdSe半导体纳米晶体的局部荧光探针。当此探针用作局部荧光源时，成千上万的纳米晶体会产生信号，而FRET SNOM操作模式的成像中仅涉及数十个（最顶端的）。用于制造探针的浸涂方法能够轻松减少活性荧光纳米晶体的数量。简要描述了使用这种方法基于单个荧光中心实现FRET SNOM的前景。 [参考：21]

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