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首页> 外文期刊>Journal of pharmaceutical sciences. >Mapping amorphous material on a partially crystalline surface: nanothermal analysis for simultaneous characterisation and imaging of lactose compacts.
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Mapping amorphous material on a partially crystalline surface: nanothermal analysis for simultaneous characterisation and imaging of lactose compacts.

机译：在部分结晶的表面上绘制无定形材料：纳米热分析，用于乳糖压块的同时表征和成像。

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摘要

The use of nanothermal analysis for mapping amorphous and crystalline lactose at a nanoscale is explored. Compressed tablets of amorphous and crystalline lactose (alone and mixed) were prepared and localised thermomechanical analysis (L-TMA) performed using micro- and nanothermal analysis in a addition to single point variable temperature pull-off force measurements. L-TMA was shown to be able to identify the different materials at a nanoscale via measurement of the thermal events associated with the amorphous and crystalline regions, while pull off force measurements showed that the adhesion of the amorphous material increased on approaching the T(g). Imaging was performed isothermally using topographic and pulsed force mode (PFM) measurements; both approaches were capable of discriminating two regions which L-TMA conformed to correspond to the two materials. In addition, force volume imaging (FVI) is suggested as a further approach to mapping the surfaces. We demonstrate that performing heated tip PFM measurements at a temperature close to the T(g) allows greater discrimination between the two regions. We therefore suggest that the nanothermal approach allows both characterisation and imaging of partially amorphous surfaces, and also demonstrate that heated tip imaging allows greater discrimination between crystalline and amorphous materials than is possible using ambient studies.
机译：探索了使用纳米热分析在纳米级绘制无定形和结晶乳糖的图谱。制备了无定形和结晶乳糖（单独和混合）的压制片剂，除了单点可变温度拉拔力测量外，还使用微热和纳热分析进行了局部热机械分析（L-TMA）。 L-TMA被证明能够通过测量与非晶和结晶区域相关的热事件而在纳米级上识别不同的材料，而拉脱力测量表明，非晶材料的粘附力在接近T（g ）。使用地形和脉冲力模式（PFM）测量等温成像。两种方法都能够区分两个L-TMA对应于两种材料的区域。另外，建议使用力体积成像（FVI）作为绘制表面的另一种方法。我们证明了在接近T（g）的温度下执行加热的烙铁头PFM测量可以在两个区域之间进行更大的区分。因此，我们建议使用纳米热方法可以对部分非晶态表面进行表征和成像，并且还可以证明，与使用环境研究相比，加热尖端成像可以更好地区分晶体和非晶态材料。

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