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INTERLAYER STRUCTURE CHANGES OF GRAPHITE AFTER HYDROGEN ION IRRADIATION

机译:氢离子辐照后石墨的层间结构变化

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Changes in graphite interlayer orderings due to keV energy hydrogen irradiation were investigated as a basic step for studies of plasma-wall interactions in fusion reactors. Distribution of interplanar spacings within a 0-45 nm deep implantation layer was measured using Fourier transforms of the (002) lattice fringe images from HRTEM taken at side facets of 700 nm diameter graphite whiskers after 1 keV H+ irradiation. Discrete increases of the interplanar spacing from 0.34 nm to 0.38, 0.41 and 0.43 nm were observed, with other indications at 0.47, 0.56, 0.62 and 0.69 nm. A sub-peak formation at 0.376, and at 0.402 nm was also observed in (002) spectra of X-ray diffraction (XRD)of 200 nm diameter whiskers after 1-6 keV H+ irradiations at 673 K,and at 623 K, respectively. The increases to 0.38 and 0.41-0.43 nm were explained through sp(3) type C-H bond formation in hexagonal carbon networks at the 'low' trapped H densities (H/C < 0.4), and the 'high' trapped H densities (H/C > 0.4), respectively, while those at 0.47-0.69 nm were attributed to interlayer, axial CH3-bond formations and CxHy molecule insertions. (C) 1997 Elsevier Science B.V. [References: 8]
机译:作为研究聚变反应堆中等离子体-壁相互作用的基本步骤,研究了由于keV能量氢辐照引起的石墨中间层顺序的变化。使用1 keV H +辐照后,在700 nm直径的石墨晶须的侧面拍摄的HRTEM的(002)晶格条纹图像的傅里叶变换,测量了0-45 nm深注入层内的晶面间距。观察到平面间距从0.34 nm离散增加到0.38、0.41和0.43 nm,其他指示分别在0.47、0.56、0.62和0.69 nm。分别在673 K和623 K上进行1-6 keV H +辐照后,在200 nm直径晶须的X射线衍射(XRD)光谱中,在(002)光谱中还观察到了0.376和0.402 nm的亚峰形成。 。增加到0.38和0.41-0.43 nm的原因是通过六方碳网络中的sp(3)型CH键形成在“低”陷阱H密度(H / C <0.4)和“高”陷阱H密度(H / C> 0.4),而在0.47-0.69 nm处的那些分别归因于层间,轴向CH3键形成和CxHy分子插入。 (C)1997 Elsevier Science B.V. [参考:8]

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