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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Surface phase transition of Cu/Si(111)-(5x5) by scanning tunnelling microscopy and photoemission study
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Surface phase transition of Cu/Si(111)-(5x5) by scanning tunnelling microscopy and photoemission study

机译:扫描隧道显微镜和光发射研究Cu / Si(111)-(5x5)的表面相变

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The phase transition process from the Si(111)-(7 x 7) surface to the Cu/Si(111)-(5 x 5) surface structure has been studied by scanning tunnelling microscopy and synchrotron radiation photoemission spectroscopy. The nucleation and growth of Cu/Si(111)-(5 x 5) on the Si(111)-(7 x 7) surface progress gradually with the increase in Cu coverage. Cu deposition on the Si(111)-(7 x 7) surface at room temperature may only involve the saturation of the surface dangling bonds, whereas a new surface phase of Cu/Si(111)-(5 x 5) is formed upon annealing, which saturates at a Cu coverage of 0.9 ML. Our experiments clearly show the surface phase transition process of the (5 x 5) structure as a function of the Cu coverage and provide useful insight into the Cu/Si(111)-(5 x 5) structure.
机译:从Si(111)-(7 x 7)表面到Cu / Si(111)-(5 x 5)表面结构的相变过程已通过扫描隧道显微镜和同步加速器辐射光发射光谱进行了研究。随着Cu覆盖率的增加,Cu / Si(111)-(5 x 5)在Si(111)-(7 x 7)表面的形核和生长逐渐进行。室温下在Si(111)-(7 x 7)表面上沉积Cu可能只涉及表面悬空键的饱和,而在表面上形成新的Cu / Si(111)-(5 x 5)表面相。退火,在0.9 ML的Cu覆盖下会饱和。我们的实验清楚地表明(5 x 5)结构的表面相变过程是Cu覆盖率的函数,并提供了对Cu / Si(111)-(5 x 5)结构的有用见解。

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