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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Polycrystalline Sm(Co,Cu)(5) films with perpendicular anisotropy grown on (0002) Ru(Cr)
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Polycrystalline Sm(Co,Cu)(5) films with perpendicular anisotropy grown on (0002) Ru(Cr)

机译：在（0002）Ru（Cr）上生长具有垂直各向异性的多晶Sm（Co，Cu）（5）膜

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摘要

Polycrystalline Sm-Co-Cu films with SmCo5 phase and (0 0 0 1) texture using a dc magnetron sputtering process were successfully fabricated directly on an (0 0 0 2) Ru(Cr) underlayer on heated glass substrates at 350 degrees C. The mean grain size of the Sm(CoCu)(5) layer is 17 nm, the smallest ever reported on SmCo5 film with perpendicular anisotropy. Strong exchange coupling between grains, as indicated by the coercivity squareness, was found in the obtained Sm(Co,Cu)(5) films. An estimated perpendicular magnetic anisotropy constant, as high as 1.4 x 10(8) erg cm(-3), was achieved on these films. An 'unusually' high perpendicular coercivity (11 kOe) was found on these exchange-coupled polycrystalline Sm(Co, Cu)(5) films. This was explained by a pinning-site model which was supported by the measurement of the coercivity angular dependence.
机译：直接在350摄氏度的加热玻璃基板上的（0 0 0 2）Ru（Cr）底层上成功制造了具有dc磁控溅射工艺的SmCo5相和（0 0 0 1）织构的多晶Sm-Co-Cu薄膜。 Sm（CoCu）（5）层的平均晶粒尺寸为17 nm，这是有垂直各向异性的SmCo5薄膜上报道的最小晶粒尺寸。在获得的Sm（Co，Cu）（5）薄膜中发现了矫顽力矩形性所指示的晶粒之间的强交换耦合。在这些薄膜上，估计的垂直磁各向异性常数高达1.4 x 10（8）erg cm（-3）。在这些交换耦合的多晶Sm（Co，Cu）（5）薄膜上发现了“异常”的高垂直矫顽力（11 kOe）。固定点模型对此进行了解释，该模型受矫顽力角相关性的支持。

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