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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method
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Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method

机译:使用时延方法分析导致k管中电击穿的机理

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Contributions of krypton ions and krypton metastables, as well as contributions of gamma-radiation and cosmic rays to the electrical breakdown in a krypton-filled tube have been analysed by use of the time delay method. The experimental results have shown that each of these contributions strictly depends on the afterglow period. The time delay method has enabled the determination of both the recombination time of positive ions and the lifetime of metastables, created in previous discharge. The obtained value of metastable lifetime is in agreement with its theoretical value. The dependence of the electrical breakdown on exposed dose rate of gamma-rays from the radiation source has also been investigated. [References: 20]
机译:通过使用时间延迟方法,分析了离子和k亚稳态的贡献,以及γ射线和宇宙射线对充tube管中电击穿的贡献。实验结果表明,这些贡献中的每一个都严格取决于余辉周期。时间延迟方法可以确定在先前放电中产生的正离子的复合时间和亚稳态的寿命。获得的亚稳态寿命值与其理论值一致。还研究了电击穿对来自辐射源的伽马射线暴露剂量率的依赖性。 [参考:20]

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