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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >OPTICAL PROPERTIES OF AGGASE2 POLYCRYSTALLINE FILMS PREPARED BY FLASH EVAPORATION
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OPTICAL PROPERTIES OF AGGASE2 POLYCRYSTALLINE FILMS PREPARED BY FLASH EVAPORATION

机译：闪蒸制备的Aggase2多晶薄膜的光学性质

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摘要

Structural studies on AgGaSe2 films prepared in vacuum of 10(-4) Pa onto glass or quartz substrates by a flash evaporation technique and annealed at 573 K for 2 h show that these films were polycrystalline and exhibited tetragonal chalcopyrite structure with a strong (112) orientation with a = 0.599 nm, c = 1.089 nm and (c/a) = 1.816. The optical constants (the refractive index n, the absorption index k and the absorption coefficient alpha) of polycrystalline AgGaSe2 films were determined from spectrophotometric measurements of the transmittance and reflectance carried out at normal incidence in the wavelength range 500-2000 nm. Graphical representations of surface and volume energy loss functions as well as the real optical conductivity as a function of photon energy show the existence of three possible optical transitions corresponding to 1.79, 1.95 and 2.2 eV respectively. [References: 25]
机译：通过快速蒸发技术在真空下以10（-4）Pa在玻璃或石英基板上制备的AgGaSe2薄膜的结构研究，并在573 K退火2 h，表明这些薄膜是多晶的，并表现出具有强力的四方黄铜矿结构（112）取向为a = 0.599 nm，c = 1.089 nm和（c / a）= 1.816。多晶AgGaSe 2薄膜的光学常数（折射率n，吸收系数k和吸收系数α）由分光光度法对透射率和反射率进行分光光度法测定，所述透射率和反射率是在垂直入射下在500-2000nm的波长范围内进行的。表面和体积能量损失函数的图形表示以及作为光子能量的函数的实际光导率表明存在三种可能的光学跃迁，分别对应于1.79、1.95和2.2 eV。 [参考：25]

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