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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Formation of YSi2-x layers on Si by high-current Y ion implantation
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Formation of YSi2-x layers on Si by high-current Y ion implantation

机译:通过大电流Y离子注入在Si上形成YSi2-x层

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摘要

Yttrium ion implantation was conducted to synthesize Y-disilicide films on silicon wafers, using a metal vapour vacuum arc ion source and the continuous and stable YSi2 films were directly obtained with neither external heating nor post-annealing. The formation mechanism of the YSi2 phase is also discussed, in terms of the temperature rise caused by ion beam heating and the ion dose in the process of implantation. [References: 16]
机译:使用金属蒸汽真空电弧离子源进行钇离子注入,以在硅片上合成Y-二硅化物膜,并且无需外部加热或后退火即可直接获得连续且稳定的YSi2膜。从离子束加热引起的温度升高和注入过程中的离子剂量方面,还讨论了YSi2相的形成机理。 [参考:16]

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