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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Perturbation analysis of sheath evolution, with application to plasma source ion implantation
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Perturbation analysis of sheath evolution, with application to plasma source ion implantation

机译:鞘层演化的扰动分析及其在等离子体源离子注入中的应用

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A perturbation model has been developed to describe the evolution of an expanding plasma sheath around a cathode after a high-voltage negative pulse is applied to the cathode, simulating the conditions in devices such as those used for plasma source ion implantation. The set of governing equations consists of two coupled collisionless fluid equations for ions, and Poisson's equation and Boltzmann's assumption for electrons. The time-dependent, self-consistent expressions for the potential, ion density and ion flux are obtained and compared successfully with experimental and simulation results. [References: 15]
机译:已经开发出一种扰动模型来描述在向阴极施加高压负脉冲后,围绕阴极的膨胀等离子体鞘层的演化,从而模拟了诸如等离子体源离子注入所用设备中的条件。控制方程组由两个耦合的离子无碰撞流体方程,泊松方程和电子的玻尔兹曼假设组成。获得了时间,自洽的势,离子密度和离子通量表达式,并将其与实验和仿真结果成功进行了比较。 [参考:15]

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