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首页> 外文期刊>Clinical immunology: The official journal of the Clinical Immunology Society >Multiplex mapping of CD4 T cell epitopes using class II tetramers.
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Multiplex mapping of CD4 T cell epitopes using class II tetramers.

机译：使用II类四聚体对CD4 T细胞表位进行多重定位。

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摘要

With the advent of class II tetramer technology, a tetramer-guided epitope mapping (TGEM) technique was developed for the identification of CD4+ T cell epitopes. This allowed the direct identification of epitopes recognized by the responding T cells, which were restricted to the single MHC allele of interest. However, as each individual carries multiple class II alleles, it would be advantageous to design an approach to identify CD4+ epitopes presented by different class II alleles at the same time. In the present study, a multiplex TGEM approach was developed to identify antigenic epitopes presented by multiple HLA class II alleles simultaneously. In this new approach, CD4+ T cells were stained with multiple sets of MHC class II tetramers-each labeled with a unique fluorescent label. Using this multiplex approach, novel epitopes from influenza antigens hemagglutinin and matrix protein presented by multiple class II alleles were identified in a single experimental setting.
机译：随着II类四聚体技术的出现，四聚体引导的表位作图（TGEM）技术被开发用于鉴定CD4 + T细胞表位。这允许直接识别被响应的T细胞识别的表位，这些表位仅限于单个感兴趣的MHC等位基因。但是，由于每个人都携带多个II类等位基因，因此设计一种方法可以同时识别不同II类等位基因呈现的CD4 +表位，这将是有利的。在本研究中，开发了一种多重TGEM方法来鉴定同时由多个HLA II类等位基因呈现的抗原表位。在这种新方法中，CD4 + T细胞用多组MHC II类四聚体染色-每个均用独特的荧光标记物标记。使用这种多重方法，在单个实验环境中鉴定了由多个II类等位基因呈现的流感抗原血凝素和基质蛋白的新表位。

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