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Two types of diffusions at the cathode/electrolyte interface in IT-SOFCs

机译：IT-SOFC中阴极/电解质界面的两种扩散

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摘要

Analytical transmission electron microscopy, in particular with the combination of energy dispersive X-ray spectroscopy (EDX) and electron energy-loss spectroscopy (EELS), has been performed to investigate the microstructure and microchemistry of the interfacial region between the cathode (La_(0.6)Sr_(0.4)Co_(0.8)Fe_(0.2)O_3, LSCF) and the electrolyte (Gd-doped ceria, GDC). Two types of diffusions, mutual diffusion between cathode and electrolyte as well as the diffusion along grain boundaries, have been clarified. These diffusions suggest that the chemical stability of LSCF and GDC are not as good as previously reported. The results are more noteworthy if we take into consideration the fact that such interdiffusions occur even during the sintering process of cell preparation.
机译：进行了分析型透射电子显微镜，特别是结合了能量色散X射线光谱（EDX）和电子能量损失谱（EELS），以研究阴极之间的界面区域（La_（0.6 ）（Sr_（0.4）Co_（0.8）Fe_（0.2）O_3，LSCF）和电解质（Gd掺杂的二氧化铈，GDC）。已经阐明了两种类型的扩散，即阴极和电解质之间的相互扩散以及沿晶界的扩散。这些扩散表明LSCF和GDC的化学稳定性不如先前报道的好。如果我们考虑到这样的相互扩散甚至在细胞制备的烧结过程中也会发生的事实，则结果更加值得注意。

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