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首页> 外文期刊>Journal of Structural Biology >Methods for testing Zernike phase plates and a report on silicon-based phase plates with reduced charging and improved ageing characteristics
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Methods for testing Zernike phase plates and a report on silicon-based phase plates with reduced charging and improved ageing characteristics

机译：Zernike相板的测试方法以及关于减少充电和改善老化特性的硅基相板的报告

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摘要

Imaging with Zernike phase plates is increasingly being used in cryo-TEM tomography and cryo-EM single-particle applications. However, rapid ageing of the phase plates, together with the cost and effort in producing them, present serious obstacles to widespread adoption. We are experimenting with phase plates based on silicon chips that have thin windows; such phase plates could be mass-produced and made available at moderate cost. The windows are coated with conductive layers to reduce charging, and this considerably extends the useful life of the phase plates compared to traditional pure-carbon phase plates. However, a compromise must be reached between robustness and transmission through the phase-plate film. Details are given on testing phase-plate performance by means of imaging an amorphous thin film and evaluating the power spectra of the images. (C) 2013 Elsevier Inc. All rights reserved.
机译：在低温TEM断层扫描和低温EM单粒子应用中，越来越多地使用Zernike相板成像。然而，相板的快速老化以及制造它们的成本和精力，为广泛采用构成了严重的障碍。我们正在试验基于具有薄窗口的硅芯片的相板;这样的相板可以大量生产并以适中的价格提供。窗口上涂有导电层以减少充电，与传统的纯碳相板相比，这大大延长了相板的使用寿命。然而，必须在坚固性和通过相板膜的透射之间达成折衷。通过对非晶薄膜成像并评估图像的功率谱，详细介绍了测试相板性能的方法。 （C）2013 Elsevier Inc.保留所有权利。

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