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首页> 外文期刊>Journal of surface investigation: x-ray, synchrotron and neutron techniques >Comparative Analysis of TXRF-Spectroscopy Efficiency under the Testing Target Excitation by Fluxes Formed by the Slit-Cut System and Waveguide-Resonator
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Comparative Analysis of TXRF-Spectroscopy Efficiency under the Testing Target Excitation by Fluxes Formed by the Slit-Cut System and Waveguide-Resonator

机译：狭缝切割系统和波导谐振器形成的通量测试目标激励下TXRF光谱效率的比较分析

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摘要

The results of the comparative study of the Ba_(1,4)eC/Y3piuStaxri(aT2l s(.ti4rO1u)cOtu,r0e (b7y t.h0e) TXRF method under conditions of the exciting flux formation by a slit-cut system and a planar x-ray waveguide resonator (PXWR) with a specific design arepresented. Experimental measurements were performed on a TXRF-model spectrometer built on the base of an HZG-4 precision digital goniometer. The spectrometer setup supplied the immutability of the x-ray optical scheme upon changing the exciting flux former. As a result, we found conditions where thé TXRF analysis of the testing target is more effective with the use of the PXWR exciting flux former.
机译：Ba_（1,4）eC / Y3piuStaxri（aT2l s（.ti4rO1u）cOtu，r0e（b7y t.h0e）TXRF方法在通过狭缝切割系统形成激励磁通和条件下的比较研究结果提出了具有特定设计的平面X射线波导谐振器（PXWR），在基于HZG-4精密数字测角仪的TXRF型光谱仪上进行了实验测量，该光谱仪的设置提供了X射线光学系统的不变性结果，我们发现了使用PXWR励磁磁通模型时，对测试目标进行TXRF分析更有效的条件。

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