Quantitative estimation of efficiency of wavelet-Processing images for single crystal structure defects

Tkal V.A.; Petrov M.N.

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Quantitative estimation of efficiency of wavelet-Processing images for single crystal structure defects

机译：单晶结构缺陷的小波处理图像效率的定量估计

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A simple procedure for quantitative estimation of the quality and efficiency of digital processing based on discrete wavelet transform (DWT) of X-ray topographic and polarization-optical images for single crystal structure defects is proposed. Digital processing of theoretical and experimental images of defects in a 6H-SiC single crystal has been performed using different wavelet types. It is shown that the brightness characteristics of the analyzed image and differential contrast may be used as a quantitative criterion of the processing quality and efficiency for the chosen wavelet. Theoretical images of typical defects in a single crystal structure calculated by the modified Indenbom-Chamrov equations have been used as a reference object.

机译：提出了一种简单的定量估计数字处理质量和效率的方法，该方法基于对单晶结构缺陷的X射线形貌和偏振光学图像的离散小波变换（DWT）。已经使用不同的小波类型对6H-SiC单晶中的缺陷的理论和实验图像进行了数字处理。结果表明，所分析图像的亮度特性和差分对比度可以用作所选小波处理质量和效率的定量标准。通过修正的Indenbom-Chamrov方程计算的单晶结构中典型缺陷的理论图像已用作参考对象。

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《Journal of surface investigation: x-ray, synchrotron and neutron techniques》 |2011年第3期|共7页
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Tkal V.A.; Petrov M.N.;
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正文语种 eng
中图分类原子核物理学、高能物理学;
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机译：单晶结构缺陷的小波处理图像效率的定量估计
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Quantitative estimation of efficiency of wavelet-Processing images for single crystal structure defects

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