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首页> 外文期刊>Journal of synchrotron radiation >Tests of a prototype pixel array detector for microsecond time-resolved X-ray diffraction
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Tests of a prototype pixel array detector for microsecond time-resolved X-ray diffraction

机译：用于微秒时间分辨X射线衍射的原型像素阵列检测器的测试

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摘要

X-ray test results from a prototype 92 * 100 pixel array detector (PAD) for use in rapid time-resolved X-ray diffraction studies are described. This integration detector is capable of taking up to eight full-frame images at microsecond frame times. It consists of a silicon layer, which absorbs the X-rays, bump-bonded to a layer of CMOS electronics in which each pixel has its own processing, storage and readout electronics. Tests indicate signal performance characteristics are comparable with phosphor-based CCD X-ray detectors, with greatly improved time resolution, comparable linearity and enhanced point spread. This prototype is a test module en route to a larger detector suitable for dedicated operation. Areas of needed improvement are discussed.
机译：描述了用于快速时间分辨X射线衍射研究的原型92 * 100像素阵列检测器（PAD）的X射线测试结果。该积分检测器能够在微秒帧时间内拍摄多达八幅全帧图像。它由一个吸收X射线的硅层组成，该硅层凸点结合到CMOS电子学层，其中每个像素都有自己的处理，存储和读出电子学。测试表明，信号性能特征可与基于磷光体的CCD X射线检测器相媲美，时间分辨率，可比线性度和点扩展性均得到了大大提高。该原型机是一个测试模块，可通往适合专用操作的更大探测器。讨论了需要改进的领域。

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