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首页> 外文期刊>電子情報通信学会技術研究報告. 電子ディスプレイ. Electronic Information Display >Dielectric Properties of Multi-Stacked Dielectric Layers of SrTiO{sub}3 and SiO{sub}2 for Inorganic Thin-Film Electroluminescent Devices
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Dielectric Properties of Multi-Stacked Dielectric Layers of SrTiO{sub}3 and SiO{sub}2 for Inorganic Thin-Film Electroluminescent Devices

机译:无机薄膜电致发光器件的SrTiO {sub} 3和SiO {sub} 2多层介质层的介电性能

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摘要

This report discusses the dielectric properties of the insulating layers for inorganic thin-film electroluminescent devices. Single-material dielectric layers, composite-material dielectric layers, double-stacked dielectric layers, and multi-stacked dielectric layers based on SrTiO{sub}3 and SiO{sub}2 materials are compared for electric flux density, which is the figure of merit, electric strength, and the breakdown mode. The composite-material layers and the double-stacked layers cannot exceed the figure of merit for the single-material layers. However, the multi-stacked layer can exceed it.
机译:该报告讨论了用于无机薄膜电致发光器件的绝缘层的介电性能。比较了基于SrTiO {sub} 3和SiO {sub} 2材料的单材料介电层,复合材料介电层,双层堆叠介电层和多层堆叠介电层的电通量密度,该图为优点,电气强度和击穿模式。复合材料层和双层叠层不能超过单材料层的品质因数。但是,多层可以超过它。

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