The crystal structures of ultra-thin organic crystalswere examined by electron diffraction method using high voltageelectron microscopy and imaging plate system. High voltageelectron microscopy reduces the dynamical scattering effect indiffraction intensities and expedient in realizing flat Ewald sphere.Imaging plate has advantages of high sensitivity, wide dynamicrange and good linear response for electron dosage compared tothe conventional electron microscopic films and is useful tomeasure electron diffraction intensities. Using the system, it wasshown that the electron diffraction method was applicable toanalyze the crystal structures of thin films of micro-crystals atatomic level resolution.
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