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首页> 外文期刊>鉄と鋼／Journal of the Iron and Steel Institute of Japan. >Direct analysis of tramp elements in steel by radio-frequency glow discharge optical emission spectrometry associated with bias-current introduction - the application to quantitative determination of tin
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Direct analysis of tramp elements in steel by radio-frequency glow discharge optical emission spectrometry associated with bias-current introduction - the application to quantitative determination of tin

机译：射频辉光放电光谱法结合偏电流引入直接分析钢中的杂质元素-在锡的定量测定中的应用

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摘要

A radio-frequency glow discharge optical emission spectrometry is applied to perform rapid and quantitative analysis of tin, which is included in commercial steels as a typical tramp element. The measuring method to introduce a bias current into the glow discharge plasma is effective for enhancing the emission intensity and thus improving the detection sensitivity. Two atomic emission lines of tin: SnI 303.411 nm and SnI 317.504 nm, can be selected as the analytical line for the determination of tin in steels. By conducting the bias current of 52 mk at the r.f. power of 120W, their emission intensities are 14 times larger than those obtained with the conventional plasma. In the case of SnI 303.411 nm, a calibration curve almost passing through the origin is obtained, leading to the limit of determination of less than 0.01 mass% Sn (several 10 ppm Sn). However, if the sample contains chromium, Cr1 303.419nm may interfere with the accurate estimation of the SnI intensity. On the other hand, major alloyed elements including chromium have no emission lines overlapping with SnI 317.504nm, although a weak Fell line overlaps just with the tin line which gives a calibration curve not passing through the origin. When SnI 317.504 nm is employed as the analytical line, the limit of determination can be estimated to be about 0.01 mass% Sn.
机译：射频辉光放电光发射光谱法被用于对锡进行快速和定量的分析，锡是作为典型的杂质元素包含在商业钢中的。将偏置电流引入辉光放电等离子体的测量方法对于增强发射强度并因此提高检测灵敏度是有效的。可以选择两条原子发射光谱线：SnI 303.411 nm和SnI 317.504 nm作为测定钢中锡的分析线。通过在r.f处传导52 mk的偏置电流功率为120W，其发射强度是传统等离子体的14倍。在SnI 303.411nm的情况下，获得几乎通过原点的校准曲线，导致测定极限为小于0.01质量％的Sn（几个10ppm的Sn）。但是，如果样品中含有铬，则Cr1 303.419nm可能会干扰SnI强度的准确估算。另一方面，包括铬在内的主要合金元素没有与SnI 317.504nm重叠的发射线，尽管较弱的Fell线仅与锡线重叠，从而给出了不通过原点的校准曲线。当将SnI 317.504nm用作分析线时，可以将测定极限估计为约0.01质量％Sn。

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