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Axially-symmetric electrostatic field calculations taking into account surface charge density singularities

机译:考虑表面电荷密度奇异性的轴对称静电场计算

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摘要

The sources of accuracy losses in electrostatic calculations of electron- and ion-optical instruments with axial symmetry and their parts are analyzed. An algorithm which takes into account these sources and reduces their contribution to computational errors is offered. The singularities of the surface charge density at the electrode ends and bends are taken into account.
机译:分析了具有轴向对称性的电子和离子光学仪器的静电计算中精度损失的来源。提供了一种考虑这些来源并减少它们对计算误差的贡献的算法。考虑到电极末端和弯曲处的表面电荷密度的奇异性。

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