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O_2 nanoparticles addition effect on microstructure and pinning properties in YBa_2Cu_3O_y

机译：O_2纳米粒子的添加对YBa_2Cu_3O_y组织和钉扎性能的影响。

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摘要

A series of YBa_2Cu_3O_y (YBCO, Y-123) samples with small amounts (0-1 wt%) of nanosized SiO_2 particles (30 nm) are synthesized in air using a solid-state reaction route. The microstructure has been characterized by transmission and scanning electron microscopy (TEM and SEM) techniques and the magnetic field and temperature dependences of the critical current density (J_c) was calculated from the magnetization measurements and by the standard four-probe method at various temperatures. Flux pinning force density {F_p) is calculated and possibility of the pinning mechanisms prevalent in type II superconductors are investigated. X-ray diffraction analysis shows that the orthorhombic structure of YBCO is maintained. Morphology examination by SEM revealed decreases of grain size with SiO_2 addition. High zero resistance temperature T_(co) value of about 90 K was maintained in YBCO with SiO_2 concentration ≤ 0.2 wt%. Cornpared to free added-sample, higher critical current densities were obtained for the YBCO sintered with low concentration SiO_2 (≤ 0.1 wt%) in applied magnetic field. TEM observations show the presence of columnar defects (2-3 nm in diameter) along the c-axis of YBCO and Si-rich nanophase embedded in the superconducting matrix. These defects are responsible for critical current densities improvement in the magnetic field of YBCO.
机译：使用固态反应路线，在空气中合成了一系列YBa_2Cu_3O_y（YBCO，Y-123）样品，这些样品中含有少量（0-1 wt％）纳米SiO_2颗粒（30 nm）。通过透射和扫描电子显微镜（TEM和SEM）技术对微观结构进行了表征，并根据磁化强度测量结果和标准四探针法在不同温度下计算了临界电流密度（J_c）的磁场和温度依赖性。计算磁通钉扎力密度（F_p），并研究II型超导体中普遍存在的钉扎机理。 X射线衍射分析表明，YBCO的正交结构得以保持。通过SEM进行的形态学检查表明，随着SiO_2的加入，晶粒尺寸减小。在SiO_2浓度≤0.2 wt％的YBCO中，保持了约90 K的高零电阻温度T_（co）值。与自由添加样品相比，在外加磁场中用低浓度SiO_2（≤0.1 wt％）烧结的YBCO获得了更高的临界电流密度。 TEM观察表明，沿YBCO的c轴存在柱状缺陷（直径2-3 nm），并且在超导基体中嵌入了富硅纳米相。这些缺陷负责改善YBCO磁场中的临界电流密度。

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