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首页> 外文期刊>Chemical Physics Letters >Ultrafast relaxation dynamics of photoexcitations in poly(3-hexylthiophene) for the determination of the defect concentration
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Ultrafast relaxation dynamics of photoexcitations in poly(3-hexylthiophene) for the determination of the defect concentration

机译:聚(3-己基噻吩)中光激发的超快弛豫动力学以确定缺陷浓度

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摘要

Ultrafast pump-probe spectroscopy of poly(3-hexylthiophene) (P3HT) films was performed using a 9-fs laser and a broadband lock-in detection system. The fast geometrical relaxation (GR) time was attributed to the transition from a free exciton (FE) to form a bound polaron pair (BPP), and the time constant was estimated to be τ_(GR) = 90 ± 2 fs. The relaxation time constant of BPP was determined as τ_(BPP) = 710 ± 40 fs. The measurement of pump-power dependence enabled us to distinguish the defect trapping process of BPPs from other parallel decay processes and to determine the defect concentration of a P3HT thin film.
机译:聚(3-己基噻吩)(P3HT)薄膜的超快泵浦光谱研究是使用9-fs激光和宽带锁定检测系统进行的。快速几何弛豫(GR)时间归因于从自由激子(FE)到形成束缚极化子对(BPP)的过渡,并且时间常数估计为τ_(GR)= 90±2 fs。 BPP的弛豫时间常数确定为τ_(BPP)= 710±40 fs。对泵浦功率依赖性的测量使我们能够将BPP的缺陷捕获过程与其他并行衰减过程区分开,并确定P3HT薄膜的缺陷浓度。

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