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首页> 外文期刊>Analytical chemistry >On-Resonance Fluorescence, Resonance Rayleigh Scattering, and Ratiometric Resonance Synchronous Spectroscopy of Molecular- and Quantum Dot-Fluorophores
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On-Resonance Fluorescence, Resonance Rayleigh Scattering, and Ratiometric Resonance Synchronous Spectroscopy of Molecular- and Quantum Dot-Fluorophores

机译：分子和量子点荧光团的共振荧光，共振瑞利散射和比率共振同步光谱。

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摘要

Existing studies on molecular fluorescence have almost, exclusively been focused on Stokes-shifted fluorescence spectroscopy (SSF) in which the emitted photon is detected at the wavelengths longer than that for the excitation photons. Information on fluorophore on-resonance fluorescence (ORF) and resonance Rayleigh scattering (RRS) is limited and often problematic due to the complex interplay of the fluorophore photon absorption, ORF emission, RRS, and solvent Rayleigh scattering. Reported herein is a relatively large-kale systematic study on fluorophore ORF and RRS using the conventional UV-vis extinction and SSF measurements in combination with the recently reported ratiometric resonance synchronous spectroscopic (R2S2, pronounced as "R-Two-S-Two") method. A series of fundamental parameters including fluorophore ORF cross sections and quantum yields have been quantified for the first time for a total of 12 molecular and 6 semiconductor quantum dot (QD) fluorophotes. All fluorophore spectra comprise a well-defined Gaussian peak with a full width at half-maximum ranging from 4 to 30 run. However, the RRS features of fluorophores differ drastically. The effect of fluorophore aggregation on its RRS, UV-vis. R2S2, and SSF spectra was also discussed. This work highlights the critical importance of the combined UV-vis,extinction, SSF, and R2S2 spectroscopic measurements for material characterizations. The method and insights, described in this work can be,directly used for improving the reliability of RRS spectroscopic methods in-chemical analysis. In addition, it should pave the way for developing:novel R2S2-based analytical applications.
机译：现有的分子荧光研究几乎都集中在斯托克斯位移荧光光谱（SSF）上，在该光谱中，以比激发光子更长的波长检测发射的光子。由于荧光团光子吸收，ORF发射，RRS和溶剂瑞利散射之间的复杂相互作用，有关荧光团的共振荧光（ORF）和共振瑞利散射（RRS）的信息有限，并且经常成问题。本文报道的是对荧光团ORF和RRS的相对较大的系统研究，该研究使用常规的UV-vis消光和SSF测量结合最近报道的比例共振同步光谱法（R2S2，发音为“ R-Two-S-Two”）方法。首次对包括12个分子和6个半导体量子点（QD）荧光粉的一系列基本参数进行了定量，包括荧光团ORF截面和量子产率。所有的荧光光谱均包含一个清晰的高斯峰，其半峰全宽为4至30游程。然而，荧光团的RRS特征完全不同。荧光团聚集对其RRS，紫外可见光的影响。还讨论了R2S2和SSF光谱。这项工作突出了组合的紫外可见，消光，SSF和R2S2光谱测量对于材料表征至关重要。这项工作中描述的方法和见解可以直接用于提高RRS光谱方法在化学分析中的可靠性。此外，它还应为开发基于R2S2的新型分析应用程序铺平道路。

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