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Method for determination of the dielectric function of a thin absorbing film on variable substrates from transmission spectra

机译:从透射光谱确定可变衬底上的吸收薄膜介电功能的方法

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摘要

Transmission spectra of bilayers of a strongly absorbing dye molecule on thin semitransparent metallic films show a pronounced variation of the shape as a function of the thickness of the metal film. The shape changes with increasing thickness of the metal film from the form of an absorption spectrum as determined by the imaginary part of the dielectric function to an antisymmetric shape characteristic of the dispersion of the real part of the dielectric function in the vicinity of a resonance. These different spectra shapes were exploited to derive the complex dielectric function of a dye layer from transmission spectra of the layer on metal films of a different thickness. This method proved to be a simple alternative to determination of the dielectric function of a thin film of a dye by spectroscopic ellipsometry.
机译:在薄的半透明金属膜上的强吸收染料分子的双层透射光谱显示出形状的明显变化,该变化是金属膜厚度的函数。形状随着金属膜厚度的增加而变化,从由介电函数的虚部确定的吸收光谱的形式改变为介电函数的实部在共振附近的分散的反对称形状特征。利用这些不同的光谱形状从不同厚度的金属膜上该层的透射光谱得出染料层的复数介电函数。事实证明,该方法是用光谱椭偏法测定染料薄膜介电功能的简单替代方法。

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