首页> 外文期刊>Applied optics >Construction of Refractive-index Profiles of Planar Waveguides with Additional Information Obtained from Surface Plasmon Resonance
【24h】

Construction of Refractive-index Profiles of Planar Waveguides with Additional Information Obtained from Surface Plasmon Resonance

机译:利用表面等离振子共振获得的附加信息来构建平面波导的折射率分布

获取原文
获取原文并翻译 | 示例
           

摘要

A surface plasmon resonance (SPR) is excited between a metal film and a graded-index planar waveguide.After the propagation constant of the SPR is measured, the refractive index near the surface of thewaveguides, which is difficult to obtain by conventional techniques, is determined experimentally. Withthis nondestructive technique, combined with the inverse analytical transfer matrix method, the planarwaveguide can be profiled to a high degree of accuracy.
机译:在金属膜和渐变折射率平面波导之间激发表面等离振子共振(SPR)。在测量SPR的传播常数之后,通过传统技术难以获得的波导表面附近的折射率为实验确定。借助这种无损技术,结合逆解析传递矩阵法,可以将平面波导的轮廓精度提高。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号