首页> 外文期刊>Applied optics >ACCURATE METHOD FOR DETERMINING THE REFRACTIVE-INDEX PROFILES OF PLANAR WAVEGUIDES IN UNIAXIAL MEDIA WITH THE OPTICAL AXIS NORMAL TO THE SURFACE
【24h】

ACCURATE METHOD FOR DETERMINING THE REFRACTIVE-INDEX PROFILES OF PLANAR WAVEGUIDES IN UNIAXIAL MEDIA WITH THE OPTICAL AXIS NORMAL TO THE SURFACE

机译:用光轴垂直于表面的单轴介质中平面波折射率的精确测定方法

获取原文
获取原文并翻译 | 示例
           

摘要

A new method for characterization of uniaxial planar waveguides from their measured effective mode indices is presented. The theory is outlined and expressions for efficient computer analysis are given. Uniaxial waveguide samples have been made in c-cut LiNbO3 by proton exchange with and without post annealing in order to test the method on both steplike and graded-index profiles. The resulting characterization of the samples is discussed in relation to the inverse WKB method. Finally, the importance of incorporating the effects of material birefringence in the characterization of these kinds of waveguides is investigated. (C) 1996 Optical Society of America [References: 18]
机译:提出了一种新的方法来表征单轴平面波导的有效模式指数。概述了该理论,并给出了用于高效计算机分析的表达式。已经在有和没有后退火的情况下通过质子交换在c切割LiNbO3中制备了单轴波导样品,以便在阶梯状和渐变折射率剖面上测试该方法。样本的最终表征将与逆WKB方法进行讨论。最后,研究了在这种类型的波导的表征中纳入材料双折射效应的重要性。 (C)1996年美国眼镜学会[参考文献:18]

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号