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Effect of surface roughness and complex indices of refraction on polarized thermal emission

机译:表面粗糙度和复折射率对偏振热发射的影响

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摘要

We present a series of measurements characterizing the dependence of polarized thermal emission on surface roughness. In particular, we measure the spectrally resolved degree of linear polarization (DOLP) for a series of roughened borosilicate (Pyrex) glass substrates as a function of the roughness parameter Ra, the root-mean-square slope distribution, and observation angle theta. Also measured are a series of smooth glass substrates coated with two particular polymers of interest, i.e., a common commercially available Krylon paint and a chemical-agent-resistant coating paint. The DOLP is measured over a 4-13 (mu)m wave band by using a modified Fourier transform IR spectrometer in which a wire-grid polarizer and a quarter-wave Fresnel rhomb are used in conjunction to measure all four Stokes parameters. In addition, we show an enhanced DOLP due to anomalous dispersion exhibited by the surface material.
机译:我们提出了一系列测量结果,描述了极化热辐射对表面粗糙度的依赖性。特别是,我们根据粗糙度参数Ra,均方根斜率分布和观察角theta来测量一系列粗糙化的硼硅酸盐(Pyrex)玻璃基板的光谱分辨线性偏振度(DOLP)。还测量了涂覆有两种特定目的聚合物的一系列光滑玻璃基材,即,常见的市售Krylon涂料和耐化学试剂涂料。通过使用改进的傅立叶变换红外光谱仪,在4-13μm波段上测量DOLP,在该光谱仪中,线栅偏振器和四分之一波长菲涅耳菱形一起用于测量所有四个斯托克斯参数。此外,由于表面材料表现出异常分散,我们显示出增强的DOLP。

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