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首页> 外文期刊>Applied optics >Fabrication and characterization of epitaxial Ba_(0.7)Sr_(0.3)TiO_(3) thin films for optical waveguide applications
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Fabrication and characterization of epitaxial Ba_(0.7)Sr_(0.3)TiO_(3) thin films for optical waveguide applications

机译：光波导应用外延Ba_（0.7）Sr_（0.3）TiO_（3）薄膜的制备与表征

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摘要

The optical properties of barium strontium titanate (Ba_(0.7)Sr_(0.3)TiO_(3); BST) thin films are described. The BST thin films were epitaxially grown upon MgO (001) substrates by pulsed laser deposition. The crystallographic properties of the BST thin films were examined by x-ray diffraction. The BST thin films were highly optically transparent in the visible region. The optical waveguide properties were characterized by a prism coupling technique. An inverse-WBK method was employed to determine the refractive-index profile along the thickness of the BST films. Optical losses were measured by a moving fiber method, and the optical losses were found to be 0.93 dB/cm for the TE_(0) mode and 1.29 dB/cm for the TM_(0) mode at 1550 nm. Electro-optic (E-O) properties were measured by a phase-modulation detection method at 632.8 nm, and the BST films exhibited a predominantly quadratic E-O effect with a quadratic E-O coefficient of 6.64 X 10~(-18) m~(2)/V~(2).
机译：描述了钛酸锶钡（Ba_（0.7）Sr_（0.3）TiO_（3）; BST）薄膜的光学特性。通过脉冲激光沉积在MgO（001）衬底上外延生长BST薄膜。通过X射线衍射检查了BST薄膜的晶体学性质。 BST薄膜在可见光区域具有很高的光学透明性。通过棱镜耦合技术表征光波导特性。采用逆WBK法确定沿BST膜厚度的折射率分布。通过移动光纤法测量光损耗，发现在1550 nm处，TE_（0）模式的光损耗为0.93 dB / cm，而TM_（0）模式的光损耗为1.29 dB / cm。通过相位调制检测方法在632.8 nm处测量电光（EO）性能，并且BST薄膜主要表现出二次EO效应，二次EO系数为6.64 X 10〜（-18）m〜（2）/ V〜（2）。

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